![]() Special thanks to Simula eX³ project () for providing high-end ARM64 systems for testing. Support UEFI-based ARM systems (arm64/aarch64), including memory test algorithms ported to ARM64 and optimized using hand-written assembly code.Updated blacklist with additional Surface Pro models with display issues.Added support for parsing DDR3 Module Manufacturer’s Specific Data.Fixed retrieval of DDR4 SPD bytes on Intel Alder Lake chipsets.Improved robustness of ECC error reporting for Intel Atom C2000 chipsets.Fixed ECC error reporting on AMD Ryzen chipsets with 8 memory channels.Fixed ECC error reporting on AMD Ryzen chipsets to include channel/slot information.Display row hammer warning, if applicable, in test completion popup message.Improved responsiveness of pattern string updated on screen.Fixed report/log files not being saved correctly for non-standard USB flash drive installs.Fixed bug in displaying/logging ECC error channel/slot number.Fixed incorrect reporting of error endianess for 128-bit test. ![]() Fixed incorrectly formatted XML Status/TestResult files sent to PXE/TFTP server (Site Edition only).Custom test definitions are enabled by specifying the TESTCFGFILE parameter (Pro Edition only) A custom test definition consists of an existing test algorithm, specific test pattern, cache settings, and number of iterations. Support custom test definitions specified by a configuration file.
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